66 ft (20 m) x 66 ft (20 m) Horizontal Near-Field Planar Scanner. NSI-MI Technologies has delivered more Near-Field Measurement Systems than ALL of our competitors combined. We are pioneers in the antenna measurement industry and continue to prove it by successfully delivering innovative programs. Read More
NEW Lidar Safety feature, C-band to mm-Wave frequencies, High accuracy positioners, Automatic electronic SNF alignment capability, Complete 3D characterization, Far-field, Holographic and Near-field patterns Read More
About NSI-MI Technologies
With over 1000 systems sold worldwide, NSI-MI Technologies offers a comprehensive range of industry leading microwave test systems. These systems cover antennas, radomes and RCS and our unique blend of mechanical, RF and software engineering capabilities allow us to customize test systems to offer specialized solutions. NSI-MI supports the aerospace/defense, automotive, wireless and academic industries. Our wide range of products also allow us to offer solutions for material, production line or general automated component testing. Our global presence enables us to offer the highest quality service and support to ensure long term use of all test products supplied. We also offer extensive in-house test and measurement facilities covering frequencies from 250 MHz to 110 GHz.
Test with ConfidenceTM
1125 Satellite Blvd., Suite 100 Suwanee, GA 30024-4629 USA
Are you going to AMTA? If so, come listen to John Wynne on Wednesday, November 7 from 3:30PM - 5:00PM as he presents an innovative approach to measuring radar systems in uncontrolled thermal environments.
Listen to Pat Pelland at AMTA on Thursday, November 8 at 8:30AM as he presents the second development phase of a new measurement technique to determine antenna system noise temperature using data acquired on a planar near-field scanner.
If you are attending ISAP, be sure to attend Dr. Daniël Janse van Rensburg's presentation on a spherical near-field scanner for measuring on-chip antennas. Save the date for Friday, October 26 fronm 8:50AM - 9:10AM. #ISAP
Listen to Scott McBride at the AMTA Symposium in Williamsburg, VA as he discusses a straightforward algorithm for creating images of stray signals in a range with a planar scanner. Mark your calendar as this is a presentation you won’t want to miss.