Auxiliary Controller

Model: MI-789

Our Auxiliary Controller (MI-789) provides extended capability for more complex measurement systems using legacy NSI-MI or VNA based systems. Besides the multi-frequency, multi-port acquisition capability, the MI-789 adds multi-beam control and triggering to the real-time data acquisition process. The beam steering interface includes two ports that can be connected to the user’s equipment to signal a change in beam state. This enables multi-beam measurements to be made on-the-fly in the same way that basic multi-frequency, multi-port measurements can be made.

The MI-789 also provides more control over the acquisition process, allowing the sequence of measurement conditions to be optimized for the fastest acquisition process. The order in which beams, channels, and frequencies are switched can be configured so that slower switching devices are changed less often. This effectively optimizes acquisition speed for the types of devices used in a given test.

Features

• Provides extended capabilities for legacy NSI-MI systems
• Controls beam steering as part of real-time acquisition
• Controls frequency triggering of external signal sources
• Provides complete control over the acquisition process
• Speeds up acquisition times by 3x to 10x when used with a Vector Network Analyzer (VNA)
• Controls up to 16 channels of external RF Multiplexers when used with a VNA