On the Effects of Industrial Robotic Arms on the Pattern of the Probe for Near-Field Measurements
Authors: Vince Rodriguez, Mark Ingerson, Gwenael Dun, Esra Celenk
Publication: AMTA 2025
Copyright Owner: NSI-MI Technologies
The first mention of a Robot for near-field
measurements of antennas appears is by Jeff Snow in [1]. This was
a simple robotic arm to do planar measurements. About 7 years
later, the use of off-the-shelf industrial robotic arms for doing
antenna measurements is introduced [2]. Since then, industrialrobot-
arm based antenna measurement systems have become
increasingly popular due to their flexibility to measure over
different surfaces allowing the system to do planar, spherical and
cylindrical. The use of other methods to perform the transform, by
numerically compute the currents on an arbitrary surface from
the measured fields has helped in the growing popularity of robotic
systems. This is related that the measurement surface does no
longer have to be a canonical surface but can be any shape.
However, the flexibility of the robots may be limited by the RF
absorber coverage used in treating them. In this paper, the authors
explore the potential scattering from the robotic arm in different
positions and its effect on the probe illuminations. This is an area
of research on the use of absorber that has not been explored until
recently [3]. Numerical experiments are conducted to explore the
effects of RF absorbers in the 300 MHz to 3 GHz range. Open
ended waveguides (OEWG) as well as dual ridged horns (see
Figure 1) are used as the probes. The results suggest that some
areas of the arm need to be treated while others can be left bare.
The analyses performed suggest that optimized treatment of
robotic arms to maintain the flexibility of the technique while also
reducing effects on the probe illuminations are possible.
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