Medium Vertical Planar Scanner Systems

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20' x 12' Vertical PNF Measurement System 30' x 15' Vertical PNF Measurement System 30' x 30' Vertical PNF Measurement System

Description

The Medium Vertical Planar Near-Field Measurement System are the ideal system for measuring medium and high gain antennas (>15 dBi) with large sized apertures making it suitable for testing large arrays or reflector antennas. They are based on an inverted “T” design and are constructed of steel. For high stability a welded cross-braced dual-rail base is used. This robust design is easy to maintain and align, and highly accurate. The high capacity probe carriage accommodates probes as low as L-band including optional roll and Z stages.

  • Features

    • High Accuracy Planarity
    • 18'x 18' (5.4 m x 5.4 m) to 30'x 30' (9.1 m x 9.1 m) Scan Area
    • Precision Rack and Pinion Drive
    • L-Band to mmWave Measurements
    • Inverted “T” Frame Design for High Accuracy
    • Far-Field, Near-Field and Holographic Patterns
    • Cylindrical and Spherical Options Available

Related Products

Atlanta

1125 Satellite Blvd., Suite 100
Suwanee, GA 30024-4629 USA

+1 678 475 8300
+1 678 542 2601
sales@nsi-mi.com

Los Angeles

19730 Magellan Drive
Torrance, CA 90502-1104 USA

+1 310 525 7000
+1 310 525 7100
sales@nsi-mi.com

CTIA/GSMA

Los Angeles, CA 09/12/2018 09:00 am 55 Days
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