Medium Vertical Planar Scanner Systems
Description
The Medium Vertical Planar Near-Field Measurement System are the ideal system for measuring medium and high gain antennas (>15 dBi) with large sized apertures making it suitable for testing large arrays or reflector antennas. They are based on an inverted T design and are constructed of steel. For high stability a welded cross-braced dual-rail base is used. This robust design is easy to maintain and align, and highly accurate. The high capacity probe carriage accommodates probes as low as L-band including optional roll and Z stages.
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Features
- High Accuracy Planarity
- 5.4 m x 5.4 m (18' x 18') to 9.1 m x 9.1 m (30' x 30') Scan Area
- Precision Rack and Pinion Drive
- L-Band to mmWave Measurements
- Inverted T Frame Design for High Accuracy
- Far-Field, Near-Field and Holographic Patterns
- Cylindrical and Spherical Options Available