Medium Horizontal Planar Scanner Systems
Medium Horizontal Planar Scanner Systems are an ideal systems for measuring large aperture antennas with medium to high gain (>15 dBi) making them suitable for testing larger arrays or reflector antennas that require a zenith orientation for testing. Medium Horizontal Planar Scanner Systems are based on an "H" frame design and are constructed using two reinforced steel X rails that support a stiff yet light weight Y-bridge on precision bearing rails. The high capacity probe stage can accommodate various probes from L to mmWave bands including any necessary RF equipment, probe extensions and optional roll and Z stages.
- High Accuracy
- 6.7 m x 6.7 m (22' x 22') to 12.1 m x 9.1 m (40' x 30') Scan Area
- Precision Rack and Pinion Drive
- L-Band to mmWave Measurements
- Far-Field, Near-Field and Holographic Patterns
- Space Based Applications