MM-Wave S-Parameter Measurements with a Vector Field Analyzer in Antenna Measurement Systems
Authors: Niyati Sanandiya, Bruce Williams, Steve Nichols
Publication: AMTA 2022
Copyright Owner: NSI-MI Technologies
Abstract — Accurate antenna characterization is important in any wireless communication system. Traditionally, electrically large antenna ranges are not equipped to perform return loss measurements and thus a separate benchtop vector network analyzer (VNA) setup is required for measuring reflection coefficient or VSWR of an antenna under test (AUT).
In this paper, we demonstrate the two-port S-parameter measurement capability of the NSI-MI Vector Field Analyzer™ (VFA) and how it can be used to integrate return loss measurements in an antenna range. We selected three known millimeter-wave components as devices-under-test (DUT) and measured the S-parameter matrix for each. These WR-10 band measurements were made using the VFA with Virginia Diodes VNAX frequency extension modules. Results are compared with Keysight’s N5225A PNA network analyzer using the same set of extension modules for verification.
S-parameter measurements taken on VFA and PNA setups are compared based on three factors: Repeatability, reproducibility, and measurement comparison. The variations between successive measurements are presented in graphical form to compare repeatability of both instrument setups. Error distribution comparison is presented for reproducibility test data to show the difference between independent repeat measurements taken on both instrument setups. Measurement comparison result shows the total difference between independent VFA and PNA measurements taken for each DUT.View The Paper