2018 Technical Papers

Optimizing RF Instrumentation for Challenging Measurements

Author: Steve Nichols
Publication: EUCAP 2018
Copyright Owner: NSI-MI Technologies

As antenna applications evolve to new technologies, test facilities must adapt to them. Broader application of millimeter-wave frequencies, more frequent use of active electronically steered array technology, and a desire for thorough verification are presenting significant challenges to antenna test ranges. The number of measurement points, frequencies, antenna states, and antenna ports has grown substantially and continues to grow. Some antenna test requirements have resulted in extremely long test times with a vast amount of data to be processes and analyzed. The impact of higher test cost and longer delivery schedules can be substantial, and test facility capacity may be stretched to its limits.

As a result, instrumentation products and automated measurements systems are being pressed to provide enhanced performance to meet the challenges of these rapidly growing test requirements. This presentation describes several ways to reduce test time by optimizing the data acquisition process and by giving due consideration to RF and millimeter-wave performance trade-offs. Specific examples of test ranges that illustrate measurement challenges and solutions will be provided. A view to the future will conclude the talk.

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Expected Changes and Additions to the Antenna Measurement Standard IEEE Std 149TM

Authors: Vince Rodriguez, Lars Foged, Jeff Fordham
Publication: IEEE Conference on Antenna Measurements & Applications, September 3, 2018
Copyright Owner: IEEE

The IEEE Standard 149 has not been revised since 1979. Over the years the Standard was reaffirmed without any changes. Recently the IEEE Standards association stopped the practice of reaffirming standards. This change in policy by the IEEE has been the “medicine” that this standard needed. A working group was organized and a project authorization request (PAR) was approved by IEEE for the document to be updated. In this paper, the expected changes to the document are described. The main change is to convert the standard to a recommended practice document. Additionally, some new techniques to measure antennas such as the use of reverberation chambers and compact ranges is discussed in more detail. Most importantly, a discussion on uncertainty is included. The result will be a very useful document for those designing and evaluating antenna test facilities, and those performing the antenna measurements.

You have requested a Reprint of an IEEE Paper

Copyright 2018 IEEE. Reprinted from IEEE Conference on Antenna Measurements & Applications, September 3, 2018.

This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of NSI-MI Technologies' products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org.

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Recommended Practice for Near-Field Antenna Measurements

Authors: Lars Foged, Vince Rodriguez, Jeff Fordham, Vikass Monebhurrun
Publication: IEEE Conference on Antenna Measurements & Applications, September 3, 2018
Copyright Owner: IEEE

The IEEE Standards Association Standards Board (IEEE-SASB) approved the IEEE Std 1720™ “Recommended Practice for Near Field Antenna Measurements” in 2012 [1]. More than fourty dedicated people from industry, academia and other institutions contributed to the creation of this new document. The main motivation for a new standard dedicated to near-field measurements was to complement the existing IEEE Std 149-1979™ “Test Procedures for Antennas” [2].

On Selecting the Most Suitable Range for Antenna Measurements in the VHF-UHF Range

Author: Vince Rodriguez
Publication: IEEE Conference on Antenna Measurements & Applications, September 3, 2018
Copyright Owner: IEEE

It is desirable to have a single facility to serve all the antenna measurement needs of an organization of company. However, there is not a one-size-fits-all antenna measurement facility to meet all antennas and frequency ranges. Trying to design and operate a Jack-of-all-trades facility is unrealistic. Such facilities may be ideal for testing part of the frequency range and types of antennas but may not be the ideal solution for certain applications. In this papers suggestions and recommendations are given for specific types of antennas mainly operating in the 30 to 3000 MHz range.

You have requested a Reprint of an IEEE Paper

Copyright 2018 IEEE. Reprinted from IEEE Conference on Antenna Measurements & Applications, September 3, 2018.

This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of NSI-MI Technologies' products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org.

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Utilizing Spherical Near-Field Measurement Data in Antenna On-Platform Performance Studies

Authors: Richard Trembinski, Derek McNamara, Daniël Janse van Rensburg
Publication: ANTEM, 2018
Copyright Owner: IEEE

Spherical near-field (SNF) measurement techniques have become the preferred approach for antenna testing. This paper argues in favour of importing detailed measured pattern data obtained from such testing into the on-platform (and other) modelling of these antennas when in situ performance is required. Two representative examples are given.

You have requested a Reprint of an IEEE Paper

Copyright 2018 IEEE. Reprinted from ANTEM Conference, 2018.

This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of NSI-MI Technologies' products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org.

By choosing to view this document, you agree to all provisions of the copyright laws protecting it


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