Spherical Scanning Measurement Challenge for Future Millimeter Wave Applications
Authors: F. Ferrero, Y. Benoit, L. Brochier, J. Lanteri, J-Y Dauvignac, C. Migliaccio, S.F. Gregson
Publication: AMTA 2015
Copyright Owner: NSI-MI Technologies
A specific set-up for probe-fed antenna pattern measurements with an articulated arm has been developed with a 500mm AUT-probe distance. This paper will give an example of far-field measurement and highlight its advantages and limitations. A near-field approach to filter the probe effect is investigated. First measurement results, including amplitude and phase patterns, will be presented. Phase data will be leveraged to develop post-processing techniques to filter probe and environmental effects.