Factors Limiting the Upper Frequency of mm-Wave Spherical Near-field Test Systems
Author: Daniël Janse van Rensburg
Antennas operating at mm-wave frequencies have led to the development of spherical near-field test systems that have to function at higher frequencies than before. This paper addresses some of the factors limiting the upper frequency bound of spherical near-field test systems in terms of what is practical with current technology. This includes mechanical positioning systems, RF sub-systems and the spherical near-field sampling requirements. Correction techniques that have been developed to enhance the performance of such measurement systems are also presented.
You have requested a Reprint of an IEEE Paper
Copyright 2015 IEEE. Reprinted from 2015 EuCAP Conference.
This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of NSI-MI Technologies' products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to firstname.lastname@example.org.
By choosing to view this document, you agree to all provisions of the copyright laws protecting it