Parametric Study of Probe Positioning Errors in Articulated Spherical Near-field Test Systems for mm-Wave Applications
Authors: Daniël Janse van Rensburg, Stuart F. Gregson
Publication: 2014 IEEE CAMA Conference
Copyright Owner: IEEE
This paper describes an articulated arm spherical near-field scanner design which transports a probe over a hyperhemispherical surface that surrounds a stationary test antenna. Surface profile data collected with a laser tracker is presented and a parametric study performed to investigate the viability of testing at mm-wave frequencies is described. Parameters such as probe radial distance, and angular positioning are investigated to assess to what extent spherical near-field testing can be performed using this structure.
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