Parametric Study of Probe Positioning Errors in Articulated Spherical Near-field Test Systems for mm-Wave Applications
Authors: Daniël Janse van Rensburg, Stuart F. Gregson
Publication: 2014 IEEE CAMA Conference
Copyright Owner: IEEE
This paper describes an articulated arm spherical near-field scanner design which transports a probe over a hyperhemispherical surface that surrounds a stationary test antenna. Surface profile data collected with a laser tracker is presented and a parametric study performed to investigate the viability of testing at mm-wave frequencies is described. Parameters such as probe radial distance, and angular positioning are investigated to assess to what extent spherical near-field testing can be performed using this structure.
You have requested a Reprint of an IEEE Paper Copyright 2014 IEEE. Reprinted from 2014 IEEE CAMA Conference.
This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of NSI-MI Technologies' products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to firstname.lastname@example.org.
By choosing to view this document, you agree to all provisions of the copyright laws protecting it