Millimeter Wave Near-Field Antenna Testing
Author: Daniël Janse van Rensburg
Publication: (MPD) Microwave Product Digest, August 2010 Issue
Copyright Owner: NSI-MI Technologies
This paper provides an overview of antenna test systems that operate in the millimeter and sub-millimeter wave bands. Techniques that have been developed to overcome technical restrictions that usually limit performance at very high RF frequencies are presented. Aspects such as thermal structural change, RF cable phase instability, scanner planarity, and probe translation during polarization rotation are addressed. These methods have been implemented and validated on test systems operating from 50 GHz up to 950 GHz.