2010 Technical Papers

Alignment Sensitivity and Correction Methods for Millimeter Wave Spherical Near-Field Measurements

Authors: Greg Hindman, Allen Newell, Luciano Dicecca, Jean Christophe Angevain
Publication: AMTA 2010
Copyright Owner: NSI-MI Technologies

Millimeter-wave measurements on spherical nearfield scanning systems present a number of technical challenges to be overcome to guarantee accurate measurements are achieved. This paper will focus on the affect of mechanical alignment errors of the spherical rotator system on the antenna’s measured performance. Methods of precision alignment will be reviewed. Sensitivity to induced mechanical alignment errors and their affect on various antenna parameters will be shown and discussed. Correction methods for residual alignment errors will also be described. The study includes 38 and 48 GHz data on the Alphasat EM model offset reflector antenna measured by TeS in Tito, Italy on a NSI-700S-60 Spherical Nearfield system, as well as a 40 GHz waveguide array antenna measured by NSI on a similar NSI-700S-60 Spherical Nearfield System at its factory in Torrance, CA, USA.


1125 Satellite Blvd. NW,
Ste. 100
Suwanee, GA 30024 USA

+1 678 475 8300
+1 678 542 2601

Los Angeles

19730 Magellan Dr.
Torrance, CA 90502 USA

+1 310 525 7000
+1 310 525 7100


Stubley Lane,
Dronfield, S18 1DJ UK

+44 1246 581500

Space-Comm Expo

Farnborough, UK Finding your local time... 9 Days www.space-comm.co.uk
This site is using cookies for analytical purposes and to provide a better user experience. Read our Privacy Policy for more information.