Sub-millimeter Wave Planar Near-field Antenna Testing
Authors: Daniёl Janse van Rensburg, Greg Hindman
Publication: EuCAP 2009
Copyright Owner: IEEE
This paper provides an overview of planar near-field antenna test systems developed for sub-millimeter wave testing. Special techniques that have been developed to overcome technical restrictions that usually limit performance at very high RF frequencies are presented. Aspects like thermal structural change, RF cable phase instability, scanner planarity and probe translation during polarization rotation are addressed. These methods have been implemented and validated on systems up to 660 GHz and 950 GHz. These cases have lead to the development of low cost commercial test systems, making antenna testing in the V and W-bands (40 – 110 GHz) cost effective.
You have requested a Reprint of an IEEE Paper
Copyright 2009 IEEE. Reprinted from EuCAP 2009 Conference.
This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of NSI-MI Technologies' products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to firstname.lastname@example.org.
By choosing to view this document, you agree to all provisions of the copyright laws protecting it.