An Overview of Near-field Sub-millimeter Wave Antenna Test Applications
Authors: Daniёl Janse van Rensburg, Greg Hindman
Publication: COMITE Conference, Czech Republic, 23-24 April 2008
Copyright Owner: IEEE
This paper provides an overview of planar nearfield antenna test systems developed for sub-millimeter wave applications used for earth observation and radio astronomy. Examples are shown of some of these test systems and methods described to overcome technical restrictions, limiting performance at very high RF frequencies. Aspects like thermal structural change, RF cable phase instability and scanner planarity are addressed. These methods have been implemented and validated on practical real-world applications up to 660 GHz and 950 GHz. These extreme cases have lead to the development of low cost commercial test systems, making antenna testing in the V and W-bands cost effective and viable today.
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Copyright 2008 IEEE. Reprinted from the COMITE Conference, Czech Republic, 23-24 April 2008.
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