2006 Technical Papers

Reduction of Truncation Error in the Near-Field-Far-Field Transformation with Planar Spiral Scanning

Authors: F. D’Agostino, F. Ferrara, C. Gennarelli, R. Guerriero, G. Riccio, C. Rizzo
Publication: AMTA 2006
Copyright Owner: University of Salerno

An elaborate and effective strategy for estimating the samples external to the measurement region in the planar spiral scanning is developed in this paper. It relies on the nonredundant sampling representations of the electromagnetic field and on the optimal sampling interpolation expansions of central type and uses the singular value decomposition method for extrapolating the outside samples. It is so possible to reduce the inevitable truncation error affecting the near-field reconstruction, thus giving rise to a more accurate far-field prediction. Numerical examples assess the effectiveness of the proposed technique.

You have requested a Reprint of a University of Salerno Paper

Copyright 2006 The University of Salerno. Reprinted from AMTA 2006 Conference

This material is posted here with permission of the University of Salerno. Such permission of the University of Salerno does not in any way imply University of Salerno endorsement of any of NSI-MI Technologies' products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the University of Salerno.

By choosing to view this document, you agree to all provisions of the copyright laws protecting it.


Atlanta

1125 Satellite Blvd. NW,
Ste. 100
Suwanee, GA 30024 USA

+1 678 475 8300
+1 678 542 2601

Los Angeles

19730 Magellan Dr.
Torrance, CA 90502 USA

+1 310 525 7000
+1 310 525 7100

NSI-MI UK

C/O AMETEK LAND,
Stubley Lane,
Dronfield, S18 1DJ UK

+44 1246 581500

AMTA

Seattle, WA Finding your local time... 9 Days 2023.amta.org
This site is using cookies for analytical purposes and to provide a better user experience. Read our Privacy Policy for more information.