Reducing Measurement Time and Estimated Uncertainties for the NIST 18 Term Error Technique

Authors: Allen Newell, Zachary Newbold
Publication: AMTA 2006
Copyright Owner: NSI-MI Technologies

This paper describes some improvements in the measurement process of the NIST 18 term error analysis that reduces the required measurement time and also improves the sensitivity of some of the tests to the individual sources of uncertainty. As a result, the measurement time is reduced by about 40 % and some of the estimated uncertainties are also improved without a reduction in the confidence levels. The reduction in measurements is accomplished by using one measurement for two or more error terms or using centerline rather than full 2D data scans for some of the terms.


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