Estimating the Uncertainties due to Position Errors in Shperical Near-Field Measurements
Authors: Allen C. Newell, Daniël Janse van Rensburg
Publication: AMTA 2003
Copyright Owner: NSI-MI Technologies
Probe position errors, specifically the uncertainty in the theta and phi position of the probe on the measurement sphere, are one of the sources of error in the calculated far-field and hologram patterns derived from spherical near-field measurements. Until recently, we have relied on analytical result for planar position errors to provide a guideline for specifying the required accuracy of a spherical measurement system. This guideline is that the angular error should not result in translation along the arc of the minimum sphere of more than λ/100.
As a result of recent simulation and analysis, expressions have been derived that relate more specifically to spherical near-field measurements. Using the dimensions of the Antenna Under Test (AUT), its directivity, the radius of the sphere (the minimum sphere) enclosing all radiating surfaces and the frequency we can estimate the errors that will result from a given position error. These results can be used to specify and design a measurement system for a desired level of accuracy and to estimate the measurement uncertainty in a measurement system.
