Estimating Z-Position Errors in Planar Near-Field Measurements From RF Measurements

Authors: Allen C. Newell, Jeff Way
Publication: AMTA 2002
Copyright Owner: NSI-MI Technologies

Z-position errors are generally the largest contributor to the uncertainty in sidelobe levels that are measured on a planar near-field range. The position errors result from imperfections in the mechanical rails that guide the motion of the measurement probe and cause it to deviate from an ideal plane. The deviations (,)zxyδcan be measured with precise optical and/or laser alignment tools and this is generally done during installation and maintenance checks to verify the scanner alignment. If the measurements are made to a very small fraction of a wavelength in Z and at intervals in X and Y approximating one half wavelength, the sidelobe uncertainty can be estimated with high confidence and is usually very small. For Z-error maps with lower resolution the resulting error estimates are generally larger or have lower confidence.

This paper describes a method for estimating the Z-position error from a series of planar near-field measurements using the antenna under test. Measurements are made on one or more planes close to the antenna and on other planes a few wavelengths farther away. The Z-distance between the close and far planes should be as large as the probe transport will allow. The difference between the holograms calculated from the close and far measurements gives an estimate of the Z-position errors. This approach has the advantage of using the actual AUT and frequency of interest and does not require specialized measurement equipment.

 

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