1998 Technical Papers

Probe Correction Effects On Planar, Cylindrical And Spherical Near-Field Measurements

Authors: Greg Hindman, David S. Fooshe
Publication: AMTA 1998
Copyright Owner: NSI-MI Technologies

The accuracy of the probe antenna pattern used for probe-corrected near-field measurements is critical for maintaining high accuracy results. The probe correction is applied differently in the three standard near-field techniques – planar, cylindrical, and spherical. This paper will review the differences in sensitivity to probe correction for the three techniques and discuss practical aspects of probe correction models and measurements.



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