Probe Correction Effects On Planar, Cylindrical And Spherical Near-Field Measurements
Authors: Greg Hindman, David S. Fooshe
Publication: AMTA 1998
Copyright Owner: NSI-MI Technologies
The accuracy of the probe antenna pattern used for probe-corrected near-field measurements is critical for maintaining high accuracy results. The probe correction is applied differently in the three standard near-field techniques – planar, cylindrical, and spherical. This paper will review the differences in sensitivity to probe correction for the three techniques and discuss practical aspects of probe correction models and measurements.