Cross-Polarized Pattern Measurements on Point-Source Compact Ranges
Author: Doren W. Hess
Publication: AMTA 1994
Copyright Owner: NSI-MI Technologies
Earlier measurement results are reviewed to understand the result that cross-polarized patterns agree well when compared between a point-source compact range and spherical near -field scanning. By taking account of the symmetry of the aperture distribution, one can see how the cross-polarized pattern can be affected only moderately by the classic polarization feature of an offset reflector geometry.