Cross-Polarized Pattern Measurements on Point-Source Compact Ranges

Author: Doren W. Hess
Publication: AMTA 1994
Copyright Owner: NSI-MI Technologies

Earlier measurement results are reviewed to understand the result that cross-polarized patterns agree well when compared between a point-source compact range and spherical near -field scanning. By taking account of the symmetry of the aperture distribution, one can see how the cross-polarized pattern can be affected only moderately by the classic polarization feature of an offset reflector geometry.



1125 Satellite Blvd. NW,
Ste. 100
Suwanee, GA 30024 USA

+1 678 475 8300
+1 678 542 2601

Los Angeles

19730 Magellan Dr.
Torrance, CA 90502 USA

+1 310 525 7000
+1 310 525 7100


Unit 51 Harley Rd.
Sheffield, S11 9SE UK

+44 7493 235224

AMTA 2021

Daytona Beach, FL Finding your local time... 84 Days

Latest Tweets

This site is using cookies for analytical purposes and to provide a better user experience. Read our Privacy Policy for more information.