Automated MIMIC Wafer RF Test System

Authors: O. M. Caldwell, William L. Tuttle, Daryl Vaughan
Publication: Fifth Annual ARPA MMIC Conference
Copyright Owner: NSI-MI Technologies

Scientific-Atlanta is presently developing a new family of high-speed, general purpose, on-wafer test systems which greatly reduces RF test times and thereby can alleviate test bottlenecks at MMIC foundries. The primary objective for the equipment developed on the Scientific-Atlanta MIMIC Phase 3 program is to reduce present MIMIC chip RF test times by an order of magnitude compared to test systems presently in use.

 

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