Automated MIMIC Wafer RF Test System

Authors: O. M. Caldwell, William L. Tuttle, Daryl Vaughan

Scientific-Atlanta is presently developing a new family of high-speed, general purpose, on-wafer test systems which greatly reduces RF test times and thereby can alleviate test bottlenecks at MMIC foundries. The primary objective for the equipment developed on the Scientific-Atlanta MIMIC Phase 3 program is to reduce present MIMIC chip RF test times by an order of magnitude compared to test systems presently in use.

 

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1125 Satellite Blvd., Suite 100
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ISAP 2018

Busan, Korea   7 Days

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