An Automated Test Sequencer for High Volume Near-Field Measurements

Authors: Greg Hindman, Dan Slater
Publication: AMTA 1993
Copyright Owner: NSI-MI Technologies

Test sequencing flexibility and high throughput are essential ingredients to a state-of-the-art near-field test range. This paper will discuss methods used by NSI to aid the operator through the near-field measurement process. The paper will describe NSI's expert system and customer applications of a unique test and processing sequencer developed by NSI for optimizing range measurement activities. The sequencer provides powerful control of the software functions including multiplexed measurements, data processing, and unattended test operations.

 

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