Speed and Accuracy for Near-Field Scanning Measurements
Authors: Doren W. Hess, David R. Morehead, Sidney J. Manning
Publication: AMTA 1992
Copyright Owner: NSI-MI Technologies
Rapid data acquisition is crucial in making comprehensive near-field scanning tests of electronically-steered phased array antennas. Multiplexed data sets can now be acquired very rapidly with high speed automatic data acquisition. To obtain high speed without giving up accuracy in probe position a feature termed subinterval triggering has been devised. To obtain simultaneously reliable thermal drift or tie scan data a feature termed block tie scans has been devised. This paper describes these two features that yield speed and accuracy in planar near-field scanning measurements.