A Dual-Ported Probe for Planar Near-Field Measurements

Authors: W. Keith Dishman, Doren W. Hess, and A. Renee Koster

A dual-linearly polarized probe developed for use in planar near-field antenna measurements is described. This probe is based upon Scientific-Atlanta’s Series 31 Orthomode Feeds originally developed for spherical near-field testing. The unique features of this probe include dual-orthogonal linear ports, high polarization purity, excellent port-to-port isolation, an integrated coordinate system reference, APC-7 connectors, and a thin-wall horn aperture to minimize probe-AUT interactions. The probe was calibrated at the National Institute of Standards and Technology (NIST) and the calibration data consisting of the probe’s complete plane-wave spectrum receiving characteristic s'02(K) were imported directly into the Model 2095/PNF Microwave 02 Measurement System. This paper describes the dual-ported probe and its application in a planar near-field range.

 

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