Measurement System Performance Considerations for Planar Near-Field Scanning Applications

Author: J. H. Pape
Publication: AMTA 1991
Copyright Owner: NSI-MI Technologies

This paper describes measurement system performance parameters that were considered during the design phase of a planar near-field measurement range for Spar Aerospace Limited. All aspects of the planar near-field measurement system are addressed. These include; instrument selection, scanner interface hardware, system controller/computer hardware, software for data collection, near-field to far-field transformation, data analysis, networking and system configuration. The Scientific-Atlanta Model 2095 Microwave Measurement System with its near-field options is used as the basis for meeting the Spar requirement. The various data collection parameters of the Model 2095 are described with special emphasis on how the factors relate to near-field requirements such as fixed grid sampling. Examples of typical test scenarios are presented as an aid in exploring detailed data collection system timing.



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