High Speed Measurements of T-R Modules

Authors: John R. Jones, Curtis E. Green

Publication: AMTA 1990

Copyright Owner: NSI-MI Technologies

An s-parameter measurement system and a procedure are described for making fast s-parameter measurements on multi-state devices. A sample test problem is considered and the application of the system and the procedure to this test problem is discussed. The important features of the system are described and timing measurements of system operation are presented.