Hand Held Microwave Reflectometer

Authors: Dan Slater, Greg Hindman
Publication: AMTA 1989
Copyright Owner: NSI-MI Technologies

Measurements of the microwave reflectivity of materials is often performed with complex test setups using probes attached to a vector network analyzer. The lack of portability of these systems prevents the user from measuring reflective properties of surfaces that are not easily moved to an appropriate test facility. This paper describes a small, hand held microwave reflectometer which is designed to perform rapid reflectivity measurements in the field. The reflectometer consists of a tuneable Ku band source, a dual polarization sampling horn, a pair of crystal detectors, and a battery powered microcomputer.

 

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