Error Analysis Techniques for Planar Near-field Measurements
Authors: Allen C. Newell
Publication: IEEE Transactions on Antennas and Propagation
Copyright Owner: IEEE
The results of an extensive error analysis on planar near-field measurements are described. The analysis provides ways for estimating the magnitude of each individual source of error and then combining them to estimate the total uncertainty in the measurements. Mathematical analysis, computer simulation, and measurement tests are all used where appropriate.
You have requested a Reprint of an IEEE Paper
Copyright 1988 IEEE. Reprinted from IEEE Transactions on Antennas and Propagation, Vol 36, No. 6, June 1988.
This material is posted here with permission of the IEEE. Such permission
of the IEEE does not in any way imply IEEE endorsement of any of NSI-MI Technologies' products or services. Internal or personal use of this
material is permitted. However, permission to reprint/republish this
material for advertising or promotional purposes or for creating new
collective works for resale or redistribution must be obtained from the
IEEE by writing to pubs-permissions@ieee.org.
By choosing to view this document, you agree to all provisions of the
copyright laws protecting it