Accurate Determination of Planar Near-field Correction Parameters for Linearly Polarized Probes

Author: Andrew G. Repjar, Allen C. Newell, Michael H. Francis

The receiving patterns (both amplitude and phase) of two probes must be known and utilized to determine accurately the complete far field of an antenna under test from near-field measurements. This process is called probe correction. When the antenna to be tested is nominally linearly polarized, the measurements are more accurate and efficient if nominally linearly polarized probes are used. Further efficiency is obtained if only one probe which is dual polarized is used instead of two probes to allow for simultaneous measurements of both components. It should be noted, however, that a single-port probe can be rotated by 90. (in effect, the second probe) to obtain the second component. A procedure used by the National Bureau of Standards (NBS) for accurately determining the plane-wave receiving parameters of both single- and dual-port linearly polarized probes is described. Examples are presented, and the effect of these probe receiving characteristics in the calculation of the parameters for the antenna under test is demonstrated using the required planar near-field theory.

 

Analysis of Compact Range Reflectors with Serrated Edges

Authors: Kevin Miller, Dr. R. W. Kreutel

The use of serrated edge treatment in the design of a compact range collimating reflector is one method of mitigating the effects of edge diffraction on quiet zone performance. In this note a physical optics analysis is applied to the serrated reflector. The computational procedure is described and several results are presented. In particular, computed results are presented for the Model 5755 compact range reflector and compared with experiment.

 

Electromagnetic and Structural Considerations in Target Support Design

Authors: Marvin L. Wolfenbarger, Pedro E. Amador

This paper will address low RCS target mounting systems. Structural and electromagnetic aspects will be considered. The 4:1 vs the 7:1 ratio ogival shell pylons will be evaluated with consideration given to structural integrity, electromagnetic scattering, and positioner size. Measured and analytic data will be used in these evaluations.

 

Error Analysis Techniques for Planar Near-field Measurements

Authors: Allen C. Newell

The results of an extensive error analysis on planar near-field measurements are described. The analysis provides ways for estimating the magnitude of each individual source of error and then combining them to estimate the total uncertainty in the measurements. Mathematical analysis, computer simulation, and measurement tests are all used where appropriate.

You have requested a Reprint of an IEEE Paper

Copyright 1988 IEEE. Reprinted from IEEE Transactions on Antennas and Propagation, Vol 36, No. 6, June 1988.

This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of NSI-MI Technologies' products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org.

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Gain and Power Parameter Measurements Using Planar Near-Field Techniques

Authors: Allen C. Newell, Robert D. Ward, Edward J. McFarlane

Equations are derived and measurement techniques described for obtaining gain, effective radiated power, and saturating flux density using planar near-field measurements. These are compared with conventional far-field techniques, and a number of parallels are evident. These give insight to the theory and help to identify the critical measurement parameters. Application of the techniques to the INTELSAT VI satellite are described.

You have requested a Reprint of an IEEE Paper

Copyright 1988 IEEE. Reprinted from IEEE Transactions on Antennas and Propagation, Vol 36, No. 6, June 1988.

This material is posted here with permission of the IEEE. Such permission of the IEEE does not in any way imply IEEE endorsement of any of NSI-MI Technologies' products or services. Internal or personal use of this material is permitted. However, permission to reprint/republish this material for advertising or promotional purposes or for creating new collective works for resale or redistribution must be obtained from the IEEE by writing to pubs-permissions@ieee.org.

By choosing to view this document, you agree to all provisions of the copyright laws protecting it


Modern Dynamic RCS and Imaging Systems

Authors: Edward B. Hart, Richard H. Bryan

This paper presents a conceptual overview of the instrumentation system and signal processing involved in dynamic RCS and Imaging measurement systems.

 

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