Accurate Determination of Planar Near-field Correction Parameters for Linearly Polarized Probes
Author: Andrew G. Repjar, Allen C. Newell, Michael H. Francis
Publication: AMTA 1988
Copyright Owner: NSI-MI Technologies
The receiving patterns (both amplitude and phase) of two probes must be known and utilized to determine accurately the complete far field of an antenna under test from near-field measurements. This process is called probe correction. When the antenna to be tested is nominally linearly polarized, the measurements are more accurate and efficient if nominally linearly polarized probes are used. Further efficiency is obtained if only one probe which is dual polarized is used instead of two probes to allow for simultaneous measurements of both components. It should be noted, however, that a single-port probe can be rotated by 90. (in effect, the second probe) to obtain the second component. A procedure used by the National Bureau of Standards (NBS) for accurately determining the plane-wave receiving parameters of both single- and dual-port linearly polarized probes is described. Examples are presented, and the effect of these probe receiving characteristics in the calculation of the parameters for the antenna under test is demonstrated using the required planar near-field theory.